19 May 2021

X-ray photoelectron spectroscopy and surface analysis for researchers in industry

Organised by:

SCI Early Careers Materials Chemistry Committee and HarwellXPS

Online Webinar: 10:00 BST

Registration Closed

This event is no longer available for registration.


X-ray Photoelectron Spectroscopy (XPS) is a surface sensitive analytical technique by which materials may be studied to obtain chemical and electronic information pertaining to the outermost layers of a sample.

This event is aimed at bringing XPS to the attention of researchers in industry in the materials sector, introducing applications and methods in ways XPS may solve problems. Industrially relevant examples will be used and complementary techniques such as ion-scattering and reflective electron energy loss spectroscopy will be introduced also.

The talks will include two UK based instrument manufacturers and view on XPS from Johnson Matthey.


This event is for researchers in industry looking to learn how XPS may benefit their work.


Ad Ettema

Scientia Omicron

Ad Ettema is technical sales specialist XPS at Scienta Omicron.
He obtained his PhD from the university of Groningen in 1993 on ARPES of 2D materials. After a post doc period at the University of Warwick in 1994 dedicated to x-ray standing waves in photoelectron spectroscopy, he became university lecturer at the TUDelft. Following 10 years at TUDelft he decided not to pursue his academic career, but to change to a commercial and supporting position. Serving 6 years for Specs GmbH in Berlin, he joined Scienta Omicron in 2013. With an academic background of more than 15 years and an industrial background of close to 15 years he understands the challenges of both academia and industry.

David Morgan


After completing his PhD in surface science and postdoctoral fellowship at Cardiff University, David took over the role of Surface Analysis Manager at the university, supporting both academia and industry and is also the Technical Manager for HarwellXPS, the EPSRC National Facility for X-Ray Photoelectron Spectroscopy. He has over 20 years of experience in surface characterization at both using laboratory and synchrotron techniques. He has authored/co-authored over 220 papers including publications in Science and Nature.

Dr Alex Walton

University of Manchester

Alex Walton is a Research Fellow in the Dept of Chemistry and the Photon Science Institute at the University of Manchester. He is the academic lead for UoM’s Near-Ambient Pressure XPS facility. His research is focussed on developing in-situ and operando techniques to study surfaces and interfaces using X-Ray Photoelectron spectroscopy, with a particular interest in applying these techniques to energy materials such as battery electrodes and electrocatalysts.

Leanne Jones

University of Liverpool

Leanne Jones obtained her BSc in Physics with Medical Applications from the University of Liverpool in 2017. She is now pursuing a PhD in condensed matter physics with Prof Tim Veal studying the electronic structure of 2D materials. As well as 2D materials, she has been involved in collaborative projects looking at batteries, PV absorbers, wide band gap oxides and transparent conducting oxides with multiple groups across the University. Her primary focus is x-ray photoemission spectroscopy (XPS) of these materials including both soft and hard XPS.

Dr Mark Isaak

University College London / HarwellXPS

Mark Isaacs is the current chair of the SCI ECR materials committee and a postdoctoral researcher with University College London and HarwellXPS. He obtained his PhD from Cardiff University in 2014 under the supervision of Profs. Adam Lee and Karen Wilson in the field of antimicrobial nanocomposites, during which time he performed a lot of research using XPS and surface analysis. Following a period of postdoctoral work in catalysis (and more XPS!) at Aston University, he joined the UK national facility for XPS (HarwellXPS) in 2018 where he is currently researching into surface analysis of nanomaterials.

Dr Mirko Weidner


Dr Mirko Weidner is a Materials Scientist who has specialized in the field of surface analytics and XPS in particular. His special interest and topic of his PhD thesis is research in transparent conductive oxides, especially SnO2, and using XPS to determine the Fermi Level position in order to understand mechanisms that limit the electrical conductivity in such materials. Since joining SPECS Surface Analysis GmbH as a regional sales manager in 2016, he has spent a lot of time in the Pacific region, in particular Japan, Korea and Taiwan. Recently, he has taken on the role of Application Expert for all things XPS at SPECS

Robin Simpson

Thermo Fisher Scientific

Dr Robin Simpson is one of the application scientists in the surface analysis team at Thermo Fisher Scientific. In this role Robin is involved in system demonstrations, customer training and the production of marketing content for the surface analysis products. He joined the team in 2017 but had close links to the team for four years prior to that while he was undertaking his engineering doctorate at the University of Surrey. During this time his thesis involved the investigation of the effects of Ar cluster depth profiling on varied material surfaces using the MAGCIS ion source.

Dr Tuğçe Eralp Erden

Johnson Matthey

Tuğçe Eralp Erden was a Marie Curie PhD student at the University of Reading, UK studying model chiral adsorption systems using synchrotron-based structural and spectroscopic techniques. After completing her PhD, she joined Johnson Matthey where she has been developing in situ and UHV surface characterisation methods for industrial catalysts and battery materials. She led the way in growing the XPS facilities and the team at Johnson Matthey, has supervised several collaborative PhD projects and is involved in the steering committees of the Versox beamline and Harwell-XPS. She is currently leading the surface spectroscopy group at Johnson Matthey.

Dr Adam Roberts MRSC, C.Chem

Kratos Analytical

After completing his PhD at UMIST Adam completed 4 years as a Research Fellow in the group of professor Raval at the University of Liverpool. From there he took an industrial position, joining Kratos Analytical as an Applications Specialist in the Surface Analysis business in 1998. With over 20 years of experience in applications of surface analysis for materials characterisation Adam has great depth of knowledge of the subject. This scientific experience has been developed in parallel with commercial sales and marketing of the scientific instruments supplied by Kratos Analytical.

Prof Robert Palgrave

University College London

Robert Palgrave is Professor of Inorganic and Materials Chemistry at UCL, and Co-Director of the EPSRC National XPS Facility, HarwellXPS. His research group work on solid state materials chemistry, with a focus on materials with applications in renewable energy generation and storage.

Dr Shaoliang Guan

Cardiff University

Shaoliang Guan is currently a Research Associate and Co-Investigator at the EPSRC National Facility for Photoelectron Spectroscopy (HarwellXPS), UK. He received his B.S. degree in Applied Chemistry from Beijing University of Chemical Technology (China) and M.Sc. in Chemical Enzymology from Queen's University Belfast (UK). After that, he received his Ph.D. degree in Electrochemistry from Cardiff University (UK) under the supervision of Prof. Gary Attard in 2015. His research interests include investigating selectively catalytic hydrogenation using electrochemical methods and CO oxy-chlorination reactions with various surface characterization techniques such as X-ray photoelectron spectroscopy and Surface enhanced Raman spectroscopy.


Welcome and Introduction
Dr Mark Isaacs, University College London / HarwellXPS
Fundamentals of XPS
Prof Robert Palgrave, University College London
Chemical state analysis
Dr David Morgan, HarwellXPS
From surface to bulk characterisation using X-ray photoelectron spectroscopy
Dr Adam Roberts, Kratos Analytical
Synchrotron-based XPS
Leanne Jones, University of Liverpool
Multi-technique Surface Analysis
Robin Simpson, Thermo Fisher Scientific
In-situ measurements and Near-ambient pressure XPS
Dr Alex Walton, University of Manchester
Lunch break
Automated high throughout, near-ambient pressure XPS for industrial scale users
Dr Mirko Weidner, SPECS
Air sensitive sample handling
Dr Shaoliang Guan, Cardiff University
HAXPES lab, the new tool for obtaining non-destructive depth information
Ad Ettema, Scientia Omicron
XPS Problem Solving at Johnson Matthey
Dr Tuğçe Eralp Erden, Johnson Matthey
Closing remarks

Booking Process/Deadlines

Booking terms and conditions

SCI Members attending this meeting are able to claim CPD points.





Organising committee

Mark Isaacs, University College London / HarwellXPS
Leanne Jones, University of Liverpool

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Conference Team

Tel: +44 (0)20 7598 1561

Email: conferences@soci.org